Error repair and knowledge acquisition via case-based reasoning

Artificial Intelligence

Volumn 91, Issue 1, 1997, Pages 85-101

  Kohno, Takeshi ^a   Hamada, Susumu ^a   Araki, Dai ^a   Kojima, Shoichi ^a   Tanaka, Toshikazu ^a  

^a TOSHIBA CORPORATION   (Japan)

Author keywords

Case based reasoning; Error repair; Knowledge acquisition; Knowledge refinement; LSI circuit layout; Pattern search; Rule based reasoning

Indexed keywords

ARTIFICIAL INTELLIGENCE; COMPUTER ARCHITECTURE; ERROR DETECTION; INTEGRATED CIRCUIT LAYOUT; KNOWLEDGE BASED SYSTEMS; LSI CIRCUITS; PROBLEM SOLVING;

CASE BASED REASONING (CBR); KNOWLEDGE REFINEMENT; RULE BASED REASONING (RBR);

KNOWLEDGE ACQUISITION;

EID: 0031098715     PISSN: 00043702     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0004-3702(96)00059-8     Document Type: Article

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