Effects of anisotropy and power spectrum of refractivity irregularities on the determination of layer thickness and layer position using the frequency domain interferometry technique

Radio Science

Volumn 32, Issue 2, 1997, Pages 437-451

  Chen, J S ^a   Liu, J Y ^a   Chu, Y H ^a  

^a NATIONAL CENTRAL UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE REFRACTION; FREQUENCY DOMAIN ANALYSIS; INTERFEROMETRY; TRACKING RADAR; ANISOTROPY; POWER SPECTRUM; RADAR; REFRACTION; THICKNESS MEASUREMENT;

FREQUENCY DOMAIN INTERFEROMETRY (FDI); SPACE ANTENNA DRIFT (SAD) METHOD;

RADIO COMMUNICATION; FREQUENCY DOMAIN ANALYSIS;

ANISOTROPIC BEHAVIORS; ANISOTROPIC STRUCTURE; CORRELATION LENGTHS; FREQUENCY CROSS CORRELATIONS; FREQUENCY DOMAIN INTERFEROMETRY; GAUSSIAN FUNCTIONS; POSITION ESTIMATION; VERTICAL CORRELATION;

EID: 0031098296     PISSN: 00486604     EISSN: None     Source Type: Journal    
DOI: 10.1029/96RS03449     Document Type: Article

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