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Volumn 63, Issue 607, 1997, Pages 636-642

Dislocation density analyses of bulk semiconductor single crystals during Czochralski growth

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COMPUTER SOFTWARE; CREEP; CRYSTAL GROWTH; DISLOCATIONS (CRYSTALS); FINITE ELEMENT METHOD; STRAIN RATE; THERMAL STRESS;

EID: 0031098018     PISSN: 03875008     EISSN: None     Source Type: Journal    
DOI: 10.1299/kikaia.63.636     Document Type: Article
Times cited : (1)

References (27)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.