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Volumn 296, Issue 1-2, 1997, Pages 133-136
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Low temperature (≤ 600 °C) unhydrogenated in-situ doped polysilicon thin film transistors: Towards a technology for flat panel displays
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Author keywords
Flat panel displays; Polysilicon thin films; Transistors
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Indexed keywords
ANNEALING;
DISPLAY DEVICES;
DOPING (ADDITIVES);
ELECTRIC CONDUCTIVITY OF SOLIDS;
ELECTRIC INSULATORS;
LOW TEMPERATURE PROPERTIES;
PLASMA ETCHING;
SEMICONDUCTING SILICON;
SEMICONDUCTOR INSULATOR BOUNDARIES;
SILICA;
SURFACE CLEANING;
FLAT PANEL DISPLAYS;
UNHYDROGENATED POLYSILICON;
THIN FILM TRANSISTORS;
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EID: 0031097905
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(96)09373-X Document Type: Article |
Times cited : (19)
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References (14)
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