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Volumn 160, Issue 1, 1997, Pages 97-104
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Investigations on the annealing effects on reactively deposited ITO thin films
a a
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ANNA UNIVERSITY
(India)
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
CARRIER CONCENTRATION;
CONDUCTIVE FILMS;
CRYSTAL ORIENTATION;
CRYSTALLIZATION;
DEPOSITION;
ELECTRIC CONDUCTIVITY OF SOLIDS;
GLASS;
HIGH TEMPERATURE EFFECTS;
SEMICONDUCTING FILMS;
SUBSTRATES;
THIN FILMS;
INDIUM TIN OXIDE (ITO) THIN FILMS;
REACTIVE DEPOSITION;
SEMICONDUCTING TIN COMPOUNDS;
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EID: 0031097406
PISSN: 00318965
EISSN: None
Source Type: Journal
DOI: 10.1002/1521-396X(199703)160:1<97::AID-PSSA97>3.0.CO;2-R Document Type: Article |
Times cited : (15)
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References (18)
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