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Volumn 52, Issue 3, 1997, Pages 281-293

Total reflection X-ray fluorescence analysis of light elements

Author keywords

Depth profile; Energy dispersive; Light elements; Synchrotron; Total reflection; X ray fluorescence

Indexed keywords

ALUMINUM; BORON; FLUORESCENCE; FLUORINE; MAGNESIUM; SODIUM; SYNCHROTRON RADIATION; TRACE ANALYSIS; X RAY PRODUCTION; X RAY SPECTROMETERS; X RAY SPECTROSCOPY; X RAY TUBES;

EID: 0031096870     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0584-8547(96)01597-2     Document Type: Review
Times cited : (18)

References (33)
  • 26
    • 0043194881 scopus 로고
    • oral presentation at Rigaku, connected with the
    • T. Arai, oral presentation at Rigaku, connected with the 5th TXRF workshop in Tsukuba, 1994.
    • (1994) 5th TXRF Workshop in Tsukuba
    • Arai, T.1
  • 29
    • 85033124230 scopus 로고    scopus 로고
    • Multilayers prepared by T. Barbee, Lawrence Livermore National Laboratory
    • Multilayers prepared by T. Barbee, Lawrence Livermore National Laboratory.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.