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Applied Spectroscopy

Volumn 51, Issue 3, 1997, Pages 433-437

Infrared reflectivity determination of alloy composition in AlxGa1-xAs and InxGa1-xAs structures

(2) Engelbrecht, J A A a Botha, J R b

a NELSON MANDELA METROPOLITAN UNIVERSITY (South Africa)

b UNIVERSITY OF THE WESTERN CAPE (South Africa)

Author keywords

AlxGa1 xAs; Alloy composition; InxGa1 xAs; Infrared reflectance

Indexed keywords

ALUMINUM ALLOYS; COMPOSITION EFFECTS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INDIUM ALLOYS; NONDESTRUCTIVE EXAMINATION; SUBSTRATES;

FOURIER TRANSFORM INFRARED REFLECTANCE SPECTROSCOPY;

SEMICONDUCTING ALUMINUM COMPOUNDS;

EID: 0031096259 PISSN: 00037028 EISSN: None Source Type: Journal
DOI: 10.1366/0003702971940332 Document Type: Article

Times cited : (2)

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