Electron scattering by Mn impurities in Si detected by cyclotron resonance measurement

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 36, Issue 3 SUPPL. A, 1997, Pages 1112-1118

  Yamamoto, Sekika ^a,b   Ohyama, Tyuzi ^a  

^a OSAKA UNIVERSITY   (Japan)

^b HOKKAIDO UNIVERSITY   (Japan)

Author keywords

Cyclotron resonance; Deep impurity; Scattering; Spin scattering; Transport property

Indexed keywords

HALL MEASUREMENTS; METAL IMPURITIES;

ANNEALING; CYCLOTRON RESONANCE; DEEP LEVEL TRANSIENT SPECTROSCOPY; DOPING (ADDITIVES); ELECTRON SCATTERING; ELECTRON SPIN RESONANCE SPECTROSCOPY; IMPURITIES; MANGANESE; PHOTOLUMINESCENCE; SECONDARY ION MASS SPECTROMETRY; THERMAL DIFFUSION IN SOLIDS; THERMAL EFFECTS;

SILICON;

EID: 0031096180     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.1112     Document Type: Article

References (10)

1. H. Brooks: Phys. Rev. 83 (1951) 879.
2. F. J. Blatt: J. Phys. Chem. Solids 1 (1957) 262.
3. J. R. Meyer and F. J. Bartoli: Phys. Rev. B 23 (1981) 5413.
4. C. Erginsoy: Phys. Rev. 79 (1950) 1013.
5. O. F. Sankey, J. D. Dow and K. Hess: Appl. Phys. Lett. 41 (1982) 064.
6. M. A. Fisher, A. R. Adams and E. P. O'Reilly: Phys. Rev. Lett. 59 (1987) 2341.
7. H. M. A. El-Ghanem and B. K. Ridley: J. Phys. C: Solid State Phys. 13 (1980) 2041.
8. R. Czaputa, H. Feichtinger and J. Oswald: Solid State Commun. 47 (1983) 223.
9. H. Nakashima and K. Hashimoto: J. Appl. Phys. 69 (1991) 1440.
10. V. S. Vikhnin, M. F. Deigen, Yu. G. Semenov and B. D. Shanina: Sov. Phys. Solid State 18 (1976) 1293.