Quantitative survey analysis by using the full inductively coupled plasma emission spectra taken from a segmented charge coupled device detector: Feasibility study

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 52, Issue 3, 1997, Pages 321-337

  Van Veen, E H ^a   Bosch, S ^a   De Loos Vollebregt, M T C ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Inductively coupled plasma atomic emission spectrometry; Multicomponent analysis; Simultaneous, quantitative analysis of all elements

Indexed keywords

CHARGE COUPLED DEVICES; PLASMA APPLICATIONS; SPECTROMETRY;

INDUCTIVELY COUPLED PLASMA ATOMIC EMISSION SPECTROMETRY; MULTICOMPONENT ANALYSIS;

EMISSION SPECTROSCOPY;

EID: 0031095509     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0584-8547(96)01588-1     Document Type: Article

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