APD's excess noise measurements using spectral analysis (FFT)

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 387, Issue 1-2, 1997, Pages 205-210

  Karar, A ^a   Tanaka, R ^a   Vanel, J Ch ^a  

^a ECOLE POLYTECHNIQUE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); AVALANCHE DIODES; ELECTRIC CURRENTS; FAST FOURIER TRANSFORMS; HIGH ENERGY PHYSICS; SIGNAL NOISE MEASUREMENT; SPECTRUM ANALYSIS;

AVALANCHE PHOTODIODES (APD); NOISE SPECTRAL DENSITY; PHOTOCURRENTS;

PHOTODIODES;

EID: 0031095335     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(96)00991-6     Document Type: Article

References (8)

1. A. Karar, Y. Musienko, R. Tanaka and J.C. Vanel, Investigation of Avalanche Photodiodes for EM Calorimeter at LHC, CMS-TN/95-095 (1995).
2. C. De la Taille, Electronique très bas bruit pour détecteur à liquide organométallique, Thesis, Ecole Polytechnique (December 1989).
3. + au silicium, Thesis, Académie de Montpellier (July 1980).
4. B. Orsal, Analyse numérique des spectres basses fréquences, Thesis, Académie de Montpellier (June 1982).
5. + au silicium, Rev. Phys. Appl. (July 1980) 1201.
6. B. Orsal, M. Decker and R. Alabedra, Chaine numérique d'analyse spectrale basse fréquence (1 kHz-100kHz) pour la caractérisation des composants opto-électroniques d'extrémité, OPTO No. 16 (October 1983).
7. M. Abraham, IEEE Trans. Circuits Syst. 6 (June 1982) 375.
8. Noise in physical systems, Proc. 5th Int. Conf. on Noise, March 13-16, 1978 (Springer, Berlin) pp. 13-24.