Electrical properties of Cu1-xAgxGaTe2 thin films

Physica Status Solidi (A) Applied Research

Volumn 160, Issue 1, 1997, Pages 151-158

  Kuhn, B ^a   Friemelt, K ^a   Fess, K ^a   Bucher, E ^a  

^a UNIVERSITY OF KONSTANZ   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; CARRIER CONCENTRATION; COPPER COMPOUNDS; ELECTRIC CONDUCTIVITY MEASUREMENT; HALL EFFECT; LATTICE CONSTANTS; POLYCRYSTALLINE MATERIALS; X RAY DIFFRACTION ANALYSIS;

FLASH EVAPORATION;

THIN FILMS;

EID: 0031094683     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(199703)160:1<151::AID-PSSA151>3.0.CO;2-H     Document Type: Article

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