Method of eigenvectors for numerical studies of multilayer gratings

Journal of X-Ray Science and Technology

Volumn 7, Issue 1, 1997, Pages 71-85

  Erofeev, V I ^a,b   Kovalenko, N V ^a,b  

^a INSTITUTE OF AUTOMATION AND ELECTROMETRY   (Russian Federation)

^b BUDKER INSTITUTE OF NUCLEAR PHYSICS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; EIGENVALUES AND EIGENFUNCTIONS; ELECTROMAGNETIC WAVE DIFFRACTION; ELECTROMAGNETIC WAVE REFLECTION; NICKEL; NUMERICAL ANALYSIS; OPTICAL MULTILAYERS; X RAY DIFFRACTION ANALYSIS;

LAMELLAR MULTILAYER GRATINGS;

DIFFRACTION GRATINGS;

EID: 0031094321     PISSN: 08953996     EISSN: None     Source Type: Journal    
DOI: 10.1006/jxra.1996.0243     Document Type: Article

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