Yield improvement of a large area magnetic field sensor array using redundancy schemes

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 5, Issue 1, 1997, Pages 28-33

  Audet, Yves ^a   Chapman, Glenn H ^a,b  

^a SIMON FRASER UNIVERSITY   (Canada)

^b IEEE

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ARRAYS; COMPUTER SIMULATION; FAILURE ANALYSIS; INTEGRATED CIRCUIT LAYOUT; LASER APPLICATIONS; MAGNETIC FIELDS; MONTE CARLO METHODS; REDUNDANCY; SEMICONDUCTOR DEVICE STRUCTURES; VLSI CIRCUITS;

LARGE AREA MAGNETIC FIELD SENSOR ARRAY; LASER INTERCONNECTION POST FABRICATION TECHNIQUE; MAGNETIC FIELD MAPPING; TACTILE SENSOR ARRAYS;

SENSORS;

EID: 0031094318     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/92.555984     Document Type: Article

References (9)

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