Electrochromic control of thin film light scattering

Journal of Applied Physics

Volumn 81, Issue 3, 1997, Pages 1464-1469

  Lindstrom T ^a   Kullman, L ^a   Ronnow D ^a,b   Ribbing, C G ^a   Granqvist, C G ^a  

^a UPPSALA UNIVERSITY   (Sweden)

^b MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ALUMINUM; CYCLIC VOLTAMMETRY; ELECTROCHROMISM; LIGHT REFLECTION; MATHEMATICAL MODELS; OPTICAL FILMS; OXIDES; PERMITTIVITY; PERTURBATION TECHNIQUES; SURFACE ROUGHNESS; THIN FILMS;

DIFFUSE REFLECTANCE; POWER SPECTRAL DENSITY; TUNGSTEN OXIDE;

LIGHT SCATTERING;

EID: 0031079144     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363882     Document Type: Article

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