New structural aspects of Tl2Ba2CaCu2Oy epitaxial thin films grown by MOCVD on LaAlO3

Physica C: Superconductivity and its Applications

Volumn 275, Issue 1-2, 1997, Pages 146-154

  Zhang, X F ^a,b   Sung, Y S ^a   Miller, D J ^a   Hinds, B J ^b   McNeely, R J ^b   Studebaker, D L ^b   Marks, T J ^b  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b NORTHWESTERN UNIVERSITY   (United States)

Author keywords

Microstructure; Tl2Ba2CaCu2Oy superconducting thin film

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL MICROSTRUCTURE; EPITAXIAL GROWTH; FILM GROWTH; INTERFACES (MATERIALS); METALLORGANIC CHEMICAL VAPOR DEPOSITION; TRANSMISSION ELECTRON MICROSCOPY;

THALLIUM 2212;

SUPERCONDUCTING FILMS;

EID: 0031079032     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(96)00695-8     Document Type: Article

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