Structural refinement of α-Bi4V2O11-x(X= 0 and 0·33) using high-resolution electron microscopy

Philosophical Magazine Letters

Volumn 75, Issue 2, 1997, Pages 105-110

  Zhou, W ^a,b   Jefferson, D A ^a   He, H ^a   Yuan, J ^b   Smith, D J ^c  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^c ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON MICROSCOPY; IONIC CONDUCTION; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; STRUCTURE (COMPOSITION); X RAY POWDER DIFFRACTION;

OXYGEN VACANCIES; STRUCTURAL REFINEMENT; SUPERSTRUCTURES;

OXIDES;

EID: 0031078904     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/095008397179813     Document Type: Article

References (5)

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2. Abraham, F., Debreuille-Gresse, M. F., Mairesse, G., and Nowogrocki, G., 1988, Solid St Ionics, 28-30, 529.
3. Huvé, M., Vannier, R., Nowogrocki, G., Mairesse, G, and Van Tendeloo, G., 1996, J. Mater. Chem., 6, 1339.
4. Joubert, Q, Jouanneaux, A., and Ganne, M., 1995, Nucl. Instrum. Metk B, 97, 119.
5. Varma, K. B. R., Subbanna, G. N., Guru Row, T. N., and Rao, C. N. R., 1990, J. Mater. Ites., 5, 2718.