Survey of reliability and availability evaluation of complex networks using Monte Carlo techniques

Microelectronics Reliability

Volumn 37, Issue 2, 1997, Pages 187-209

  Wang, Hongzhou ^a   Pham, Hoang ^a  

^a DEPARTMENT OF INDUSTRIAL AND SYSTEMS ENGINEERING   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; AVAILABILITY; COMPUTER SIMULATION; FAILURE ANALYSIS; LARGE SCALE SYSTEMS; PROBLEM SOLVING; RANDOM PROCESSES; RELIABILITY; STATISTICS;

BAYES METHOD; RANDOM VARIATE GENERATION ALGORITHMS; VARIANCE REDUCTION METHODS;

MONTE CARLO METHODS;

EID: 0031078884     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(96)00058-3     Document Type: Article

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