A note on the preservation of the NBUC class under formation of parallel systems with dissimilar components

Microelectronics Reliability

Volumn 37, Issue 2, 1997, Pages 359-360

  Cai, Jun ^a   Wu, Yanhong ^b  

^a Dept of Electrical and Computer Engineering   (Canada)

^b UNIVERSITY OF ALBERTA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

FUNCTIONS; INSPECTION; NUMERICAL METHODS; PROBABILITY; RANDOM PROCESSES; REPAIR;

ELEMENTARY PROBABILITY TECHNIQUE; INDUCTION METHOD; NEW BETTER THAN USED;

RELIABILITY;

EID: 0031078862     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(96)00073-X     Document Type: Article

References (4)

1. Barlow, R. E. and Proschan, F., Statistical Theory of Reliability and Life Testing. Silver Spring, Maryland, 1981.
2. Abouammoh, A. M. and El-Neweihi, E., Closure of the NBUE and DMRL classes under formation of parallel system. Statist. Prob. Lett., 1986, 4, 223-225.
3. Cao, J. and Wang, Y., The NBUC and NWUC classes of life distributions. J. Appl. Prob., 1991, 28, 473-479.
4. Hendi, M. I., Mashhour, A. F. and Montasser, M. A., Closure of the NBUC class under formation of parallel systems. J. Appl. Prob., 1993 30, 975-978.