Estimation of the reliability function using the delay-time models

Microelectronics Reliability

Volumn 37, Issue 2, 1997, Pages 323-327

  Attia, A F ^a  

^a Cairo University   (Egypt)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; FAILURE (MECHANICAL); INSPECTION; MATHEMATICAL MODELS; NUMERICAL METHODS; PROBABILITY DENSITY FUNCTION;

DELAY TIME MODEL; EXPONENTIAL DISTRIBUTION; RELIABILITY FUNCTION;

RELIABILITY;

EID: 0031078716     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(96)00012-1     Document Type: Article

References (7)

1. Christer, A. H., Delay time model of reliability of equipment subject to inspection monitoring. J. Opl. Res. Soc., 1987, 33, 723-732.
2. Christer, A. H. and Waller, W. M., Reducing production downtime using delay time-analysis. J. Opl. Res. Soc., 1984, 35, 499-512.
3. Christer, A. H. and Waller, W. M., An O.R. approach to planned maintenance: modeling P.M. for a vehicle fleet. J. opl. Res. Soc., 1984, 35, 967-984.
4. Cerone, P., Inspection interval for maximum future reliability using the delay time model. Eur. J. Opl. Res., 1993, 68, 236-250.
5. Barlow, R. E. and Proschan, F., Statistical Theory of Reliability and Life Testing. Holt, Rinehart and Winston, New York, 1975.
6. Cerone, P., Inspection interval for maximum future reliability using the delay time model. Eur. J. opl. Res. 1993, 68, 236-250.
7. Cohen, A. C., Maximum likelihood estimation in the Weibull distribution based on complete and censored samples. Technometric, 1965, 5, 579-588.