Application of the SIMS method in studies of Cr segregation in Cr-doped CoO: II, depth profiles

Journal of the American Ceramic Society

Volumn 80, Issue 2, 1997, Pages 349-356

  Bernasik, Andrzej ^a,c   Nowotny, Janusz ^b   Scherrer, Stanislas ^a   Weber, Sylvian ^a  

^a UNIVERSITÉ DE LORRAINE   (France)

^b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

^c AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CHROMIUM; COOLING; DECOMPOSITION; DIFFUSION; INTERFACES (MATERIALS); MATHEMATICAL MODELS; OXIDES; SEGREGATION (METALLOGRAPHY); SINGLE CRYSTALS; SURFACE STRUCTURE; THERMODYNAMICS;

COBALT OXIDE; DEPTH PROFILES; DESEGREGATION; LATTICE TRANSPORT KINETICS; MOLAR RATIO;

SECONDARY ION MASS SPECTROMETRY;

EID: 0031078561     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1997.tb02837.x     Document Type: Article

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