Structure and stability of the twofold surface of icosahedral al-pd-mn by low-energy electron diffraction and x-ray photoemission spectroscopy

Physical Review Letters

Volumn 78, Issue 6, 1997, Pages 1050-1053

  Shen, Z ^a   Jenks, C J ^a   Anderegg, J ^a   Delaney, D W ^a   Lograsso, T A ^a   Thiel, P A ^a   Goldman, A I ^a  

^a IOWA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM ALLOYS; ANNEALING; AUGER ELECTRON SPECTROSCOPY; COMPOSITION; CRYSTAL GROWTH; LOW ENERGY ELECTRON DIFFRACTION; NANOSTRUCTURED MATERIALS; SPUTTERING; TANTALUM; X RAY PHOTOELECTRON SPECTROSCOPY;

ALUMINUM PALLADIUM MANGANESE ALLOYS; FACE CENTERED ICOSAHEDRAL PHASE; FACETING; TWOFOLD SURFACE;

SURFACE STRUCTURE;

EID: 0031078084     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.78.1050     Document Type: Article

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