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Volumn 40, Issue 1, 1997, Pages 12-21

Experiences with the MacTester in computer science and engineering education

Author keywords

Functional test and debug of ASIC's and FPGA's; Low cost hardware test environments for use in education; Mixed mode simulation of digital systems

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; COMPUTER DEBUGGING; COMPUTER HARDWARE; COMPUTER SCIENCE; COMPUTER SIMULATION; COMPUTER SOFTWARE; ENGINEERING EDUCATION; INTEGRATED CIRCUIT TESTING; LOGIC GATES; TESTING;

EID: 0031078031     PISSN: 00189359     EISSN: None     Source Type: Journal    
DOI: 10.1109/13.554665     Document Type: Article
Times cited : (4)

References (13)
  • 2
    • 33747042122 scopus 로고
    • Establishing a modern digital design lab
    • Conference Management Services, Menlo Park, CA, July Also available as Dept. of CSE, Univ. of Washington, Tech. Rep. UW CSE TR 92-08-01, Aug. ch. 4
    • C. Ebeling and G. Borriello, "Establishing a modern digital design lab," in Proc. 4th Microelectronic Systems Education Conf., Conference Management Services, Menlo Park, CA, July 1991. Also available as Dept. of CSE, Univ. of Washington, Tech. Rep. UW CSE TR 92-08-01, Aug. 1992, ch. 4.
    • (1991) Proc. 4th Microelectronic Systems Education Conf.
    • Ebeling, C.1    Borriello, G.2
  • 3
    • 33747070694 scopus 로고
    • MacTester: A low-cost functional tester for interactive testing and debugging
    • Conference Management Services, Menlo Park, CA, July Also available as Dept. of CSE, Univ. of Washington, Tech. Rep. UW CSE TR 92-08-01, Aug. ch. 3
    • C. Ebeling and N. R. McKenzie, "MacTester: A low-cost functional tester for interactive testing and debugging," in Proc. 3rd Microelectronic Systems Education Conf., Conference Management Services, Menlo Park, CA, July 1990. Also available as Dept. of CSE, Univ. of Washington, Tech. Rep. UW CSE TR 92-08-01, Aug. 1992, ch. 3.
    • (1990) Proc. 3rd Microelectronic Systems Education Conf.
    • Ebeling, C.1    McKenzie, N.R.2
  • 4
    • 33747050566 scopus 로고
    • Dept. of CSE, Univ. of Washington, Tech. Rep. UW CSE TR 89-12-01, Dec.
    • N. R. McKenzie, "The UW VLSI chip tester," Dept. of CSE, Univ. of Washington, Tech. Rep. UW CSE TR 89-12-01, Dec. 1989.
    • (1989) The UW VLSI Chip Tester
    • McKenzie, N.R.1
  • 5
    • 0003651029 scopus 로고
    • 2100 Logic Drive, San Jose, CA
    • Xilinx Inc., The Programmable Logic Data Book, 1993, 2100 Logic Drive, San Jose, CA.
    • (1993) The Programmable Logic Data Book
  • 6
    • 0004006612 scopus 로고
    • Redwood City, CA: Benjamin/Cummings
    • R. H. Katz, Contemporary Logic Design. Redwood City, CA: Benjamin/Cummings, 1994, pp. 421-426.
    • (1994) Contemporary Logic Design , pp. 421-426
    • Katz, R.H.1
  • 11
    • 33747074780 scopus 로고
    • Dept. of CSE, Univ. of Washington, Tech. Rep. UW CSE TR 93-09-05, Sept.
    • R. Bedichek and C. P. Brown, "The Meerkat multicomputer," Dept. of CSE, Univ. of Washington, Tech. Rep. UW CSE TR 93-09-05, Sept. 1993.
    • (1993) The Meerkat Multicomputer
    • Bedichek, R.1    Brown, C.P.2
  • 13
    • 0026152657 scopus 로고
    • Universal logic implementer: A general purpose tool for a digital logic design laboratory
    • May
    • M. L. Manwaring, W. I. Baker, V. D. Malbasa, and D. A. Seamans, "Universal logic implementer: A general purpose tool for a digital logic design laboratory," IEEE Trans. Educ., vol. 34, May 1991.
    • (1991) IEEE Trans. Educ. , vol.34
    • Manwaring, M.L.1    Baker, W.I.2    Malbasa, V.D.3    Seamans, D.A.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.