A universal rig for mechanical testing of thin specimens using a novel loading assembly controlled by computer

Measurement Science and Technology

Volumn 8, Issue 2, 1997, Pages 178-183

  Rubiolo, G H ^a,b   Benites, G M ^a  

^a UNIVERSIDAD DE BUENOS AIRES   (Argentina)

^b DEPARTAMENTO DE FÍSICA   (Argentina)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER CONTROL; CREEP TESTING; LOADS (FORCES); PERFORMANCE; PERSONAL COMPUTERS; STRAIN RATE; STRESS RELAXATION; TENSILE TESTING; THERMAL EFFECTS;

THIN SPECIMENS;

TEST FACILITIES;

EID: 0031077640     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/8/2/011     Document Type: Article

References (10)

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2. Hoffman RW 1965 Physics of Thin Films vol 3 (New York: Academic)
3. Kuhlmann-Wilsdorf D and Srinivasa Raghavan K 1962 New tensile testing machine for thin specimens Rev. Sci. Instrum. 33 930-3
4. Marsh D M 1961 Micro-tensile testing machine J. Sci. Instrum. 38 229-34
5. Menter J W and Pashley D W 1959 Structure and Properties of Thin Films (New York: Wiley) p 111
6. Schenk A, Berka L and Vasina P 1990 A new tensile tester for micro-scale strain measurements in the scanning electron microscope Meas. Sci. Technol. 1 136-8
7. Shinohara A H, Sato T, Saito F, Tomioka T and Arai Y 1993 A novel method for measuring direct compressive properties of carbon fibres using a micro-mechanical compression tester J. Mater. Sci. 28 6611-6
8. Stephens R R and Hoeppner D W 1988 New apparatus for studying fatigue deformation at high magnifications Rev. Sci. Instrum. 58 1412-9
9. 18 Scri. Metall. 13 195-8
10. Taub A J and Luborsky F E 1981 Creep stress relaxation and structural change of amorphous alloys Acta Metall. 29 1948-81