The use of burr type XII distribution on software reliability growth modelling

Microelectronics Reliability

Volumn 37, Issue 2, 1997, Pages 305-313

  Abdel Ghaly, A A ^a   Al Dayian, G R ^a   Al Kashkari, F H ^a  

^a KING ABDULAZIZ UNIVERSITY   (Saudi Arabia)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COMPUTER SOFTWARE; ERROR DETECTION; PROBABILITY; RANDOM PROCESSES; STATISTICS; WEIBULL DISTRIBUTION;

BAYESIAN MODEL; BURR TYPE XII DISTRIBUTION; NONHOMOGENEOUS POISSON PROCESS; ORDER STATISTICS; SOFTWARE RELIABILITY GROWTH MODEL;

RELIABILITY;

EID: 0031077337     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/0026-2714(95)00124-7     Document Type: Article

References (12)

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