Effects of palladium dispersions on gas-sensitive conductivity of semiconducting Ga2O3 thin-film ceramics

Journal of the American Ceramic Society

Volumn 80, Issue 2, 1997, Pages 317-323

  Bausewein, Andreas ^a   Hacker, Birgitta ^a   Fleischer, Maximilian ^a   Meixner, Hans ^a  

^a SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DEPOSITION; DISPERSIONS; FILM GROWTH; HYDROGEN; OXYGEN; PALLADIUM; PARTICLE SIZE ANALYSIS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING FILMS; SEMICONDUCTING GALLIUM COMPOUNDS; THIN FILMS;

GAS SENSITIVITY; SEMICONDUCTING CERAMICS; WET CHEMICAL TECHNIQUE; X RAY PHOTOEMISSION SPECTROSCOPY;

CERAMIC MATERIALS;

EID: 0031076684     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1997.tb02832.x     Document Type: Article

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