Charge transfer and a new image state of C60 on Cu(111) surface studied by inverse photoemission

Solid State Communications

Volumn 101, Issue 5, 1997, Pages 337-341

  Tsuei, K D ^a   Johnson, P D ^b  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

A. fullerenes; A. surfaces and interfaces; D. electronic states

Indexed keywords

ADSORPTION; ANNEALING; ELECTRON ENERGY LEVELS; ELECTRONIC STRUCTURE; FERMI LEVEL; INTERFACES (MATERIALS); LOW ENERGY ELECTRON DIFFRACTION; PHOTOEMISSION; RESONANCE; SURFACE STRUCTURE; ULTRATHIN FILMS;

IMAGE STATE; INVERSE PHOTOEMISSION (IPES);

FULLERENES;

EID: 0031076543     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(96)00590-X     Document Type: Article

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