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Volumn 372, Issue 1-3, 1997, Pages
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Annealing instabilities in small fabricated structures
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Author keywords
Scanning electron microscopy; Semiconductor surfaces; Silicon; Surface morphology; Surface tension
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Indexed keywords
ANNEALING;
FREE ENERGY;
MASS TRANSFER;
MORPHOLOGY;
SURFACE PHENOMENA;
SURFACE TENSION;
SURFACES;
CYLINDRICAL SECOND PHASE MATERIAL;
RAYLEIGH INSTABILITY;
SILICON WAFERS;
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EID: 0031075974
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(96)01263-0 Document Type: Article |
Times cited : (4)
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References (16)
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