Adsorption of SO2 on Cu(100) studied by X-ray absorption fine structure spectroscopy and scanning tunneling microscopy

Surface Science

Volumn 373, Issue 1, 1997, Pages 1-10

  Nakahashi, T ^a   Terada, S ^a   Yokoyama, T ^a   Hamamatsu, H ^a   Kitajima, Y ^b   Sakano, M ^a   Matsui, F ^a   Ohta, T ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

Author keywords

Copper; Near edge extended X ray absorption fine structure (NEXAFS); Scanning tunneling microscopy; Sulphur dioxide; Surface extended X ray absorption fine structure (SEXAFS); Surface structure; X ray photoelectron spectroscopy

Indexed keywords

ADSORPTION; AUGER ELECTRON SPECTROSCOPY; LOW ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; SULFUR DIOXIDE; SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY;

NEAR EDGE EXTENDED X RAY ABSORPTION FINE STRUCTURE; SURFACE EXTENDED X RAY ABSORPTION FINE STRUCTURE;

COPPER;

EID: 0031075339     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(96)01144-2     Document Type: Article

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