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Applied Surface Science

Volumn 109-110, Issue , 1997, Pages 20-24

Solidification phenomena in Ge films upon nano- and pico-second laser pulse melting

(5) Afonso, C N a Solis, J a Vega, F b Siegel, J a Szyszko, W c

a INSTITUTO DE ÓPTICA (Spain)

b UNIVERSITAT POLITÈCNICA DE CATALUNYA (Spain)

c MARIA CURIE SK ODOWSKA UNIVERSITY (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; IRRADIATION; LASER BEAM EFFECTS; LASER PULSES; MELTING; SEMICONDUCTING SILICON; SOLIDIFICATION; SUBSTRATES; THERMAL DIFFUSION IN SOLIDS; THICKNESS MEASUREMENT;

AMORPHOUS GERMANIUM FILMS;

THIN FILMS;

EID: 0031074988 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(96)00614-9 Document Type: Article

Times cited : (6)

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