Studies of target materials and wavelength for laser ablation-deposition of Ti:Sapphire

Applied Surface Science

Volumn 109-110, Issue , 1997, Pages 345-349

  Dyer, P E ^a   Gonzalo, J ^a   Key, P H ^a   Sands, D ^a   Schmidt, M J J ^a  

^a UNIVERSITY OF HULL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; CERAMIC MATERIALS; CRYSTALLINE MATERIALS; DEPOSITION; INFRARED SPECTROMETERS; LASER ABLATION; OPTIMIZATION; OXYGEN; PULSED LASER APPLICATIONS; SAPPHIRE; SUBSTRATES; ULTRAVIOLET SPECTROMETERS;

LASER ABLATION DEPOSITION (LAD); TITANIUM DOPED SAPPHIRE;

THIN FILMS;

EID: 0031074969     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(96)00672-1     Document Type: Article

References (10)

1. D.B. Chrisey and G.K. Hubler, Eds., Pulsed Laser Deposition of Thin Films (Wiley, New York, 1994).
2. M. Jelinek, Czech Academy of Sciences, private communication.
3. P.E. Dyer, A. Issa, P.H. Key and P. Monk, Supercond. Sci. Technol. 3 (1990) 472
4. E. Toussaere and J. Zyss, Thin Solid Films 234 (1993) 432.
5. K.J. Attrill, Ellipsometric and photometric techniques for the measurement of the optical constants of thin films and surfaces: the development of a general multilayer programme, PhD Thesis, Univ. of Bradford, UK (1986).
6. E.D. Palik, Handbook of Optical Constants of Solids (Academic Press, Orlando, 1985).
7. Optics Guide 5, Melles Griot.
8. P.E. Dyer, A. Issa and P.H. Key, Appl. Surf. Sci. 46 (1990) 89.
9. S.M. Sze, VLSI Technology, 2nd ed. (McGraw-Hill, 1988).
10. JCPDS reference cards.