Correction of matrix effects in quantitative elemental analysis with laser ablation optical emission spectrometry

Journal of Analytical Atomic Spectrometry

Volumn 12, Issue 2, 1997, Pages 183-188

  Chaleard C ^a   Mauchien, P ^a   Andre, N ^a   Uebbing, J ^a,b   Lacour, J L ^a   Geertsen, C ^a,c  

^a DIF   (France)

^b LEIBNIZ INSTITUT FÜR ANALYTISCHE WISSENSCHAFTEN ISAS E V   (Germany)

^c ALCAN INTERNATIONAL LIMITED   (Canada)

Author keywords

Elemental analysis; Laser ablation; Matrix effects; Optical emission spectrometry

Indexed keywords

ALUMINUM ALLOYS; BRASS; LASER ABLATION; MATHEMATICAL MODELS; MATRIX ALGEBRA; SAMPLING; SPECTROSCOPIC ANALYSIS; STEEL; TRACE ELEMENTS;

ELEMENTAL ANALYSIS; MATRIX EFFECTS; OPTICAL EMISSION SPECTROMETRY; QUANTITATIVE ELEMENTAL ANALYSIS;

EMISSION SPECTROSCOPY;

EID: 0031073936     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/A604456E     Document Type: Article

References (24)

1. Brech, F., and Cross, L., Appl. Spertrosc., 1962, 16, 59.
2. Moenke-Blankenburg, L., Spectrochim. Acta Rev., 1993, 15, 1.
3. Carlhoff, C., Lorenzen, C. J., Nick, K. P., and Siebeneck, H. J., in In-Process Optical Measurements, ed. Spring, K. H., Proc. SPIE, SPIE Publications, Bellingham, 1989.
4. Lorenzen, C. J., Carlhoff, C, Hahn, U., and Jogwich, M., J. Anal. At. Spectrom., 1992, 7, 1029.
5. Andre, N., Geertsen, C., Lacour, J. L., Mauchien, P., and Sjöström, S., Spectrochim. Acta, Part B, 1994, 49, 12 and 1363.
6. Sabsabi, M., Cielo, P., Boily, S., and Chaker, M., Proc. SPIE-Int. Soc. Opt. Eng., 1993, 199, 2069.
7. Ready, J. F., Effects of High Power Laser Radiation, Academic Press, New York, 1971.
8. Von Allmen, M., Laser Beam Interactions With Materials, Springer Series in Material Science, Springer, Berlin, 1987.
9. Radziemski, L. J., and Cremers, D. A., Laser-induced Plasmas and Applications, Marcel Dekker, New York, 1989.
10. Geertsen, C., Lacour, J. L., Mauchien, P., and Pierrard, L., Spectrochim. Acta Part B, 1996, 51, 1403.
11. Kagawa, K., Kawai, K., Tani, M., and Kobayashi, T., Appl. Spectrosc., 1994, 48, 198.
12. Aguilera, J. A., Aragon, C., and Campos, J., Appl. Spectrosc., 1992, 46, 1382.
13. Chan, W. T., and Russo, R. E., Spectrochim. Acta, Part B, 1991, 46, 1471.
14. Wisbrun, R., Schechter, I., Niessner, R., Schröder, H., and Kompa, K. L., Anal. Chem., 1994, 66, 2964.
15. Wisbrun, R., Niessner, R., and Schröder, H., Anal. Meas. Instrum., 1993, 1, 17.
16. Ko, J. B., Sdorra, W., and Niemax, K., Fresenius' Z. Anal. Chem., 1989, 335, 648.
17. Ciocan, A., Hiddemann, L., Uebbing, J., and Niemax, K., J. Anal. At. Spectrom., 1993, 8, 273.
18. Geertsen, C., Lacour, J. L., and Mauchien, P., paper presented at the E-MRS 1995 Spring Meeting, Symposium F, COLA '95, Strasbourg, France, May 22-26, 1995.
19. Autin, M., Briand, A., Mauchien, P., and Mermet, J. M., Spectrochim. Acta. Part B, 1993, 48, 851.
20. Russo, R. E., Appl. Spectrosc., 1995, 49, 14A.
21. Chen, G., and Yeung, E. S., Anal. Chem., 1988, 60, 2258.
22. Pang, H., Wiederin, D. R., Houk, R. S., and Yeung, E. S., Anal. Chem., 1991, 63, 390.
23. Shannon, M. A., and Russo, R. E., paper presented at the E-MRS 1995 Spring Meeting, Symposium F, COLA '95, Strasbourg, France, May 22-26, 1995.
24. Vertes, A., Dreyfus, R. W., and Platt, D. E., in IBM Research Report, RC 18520, 1992.