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Volumn E80-C, Issue 2, 1997, Pages 320-325

Hillock-free aluminum-based alloy interconnections for active-matrix liquid-crystal displays

Author keywords

Active matrix; Aluminum based alloy film; Liquid crystal display

Indexed keywords

ALUMINUM ALLOYS; ELECTRIC CONDUCTIVITY OF SOLIDS; ETCHING; LIQUID CRYSTAL DISPLAYS; MAGNETIC FILMS; SPUTTER DEPOSITION;

EID: 0031073117     PISSN: 09168524     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (7)

References (5)
  • 1
    • 33746354849 scopus 로고
    • TFT-LCD gate and data bus-line design and process technologies
    • Orland, U.S.A., May
    • M.Ikeda, "TFT-LCD gate and data bus-line design and process technologies," SID (Society for Information Display) Int. Symp. Dig. Tech. Pap., Orland, U.S.A., vol.26, pp.11-14, May 1995.
    • (1995) SID (Society for Information Display) Int. Symp. Dig. Tech. Pap. , vol.26 , pp. 11-14
    • Ikeda, M.1
  • 2
    • 33746366410 scopus 로고
    • A transmission electron microscopy study of hillocks in thin aluminum films
    • F.Ericson, N.Krisensen, J-A.Schweitz, and U.Smith, "A transmission electron microscopy study of hillocks in thin aluminum films," J. Vac. Sci. Technol., vol.B9, no.1, pp.5863, 1991.
    • (1991) J. Vac. Sci. Technol. , vol.B9 , Issue.1 , pp. 5863
    • Ericson, F.1    Krisensen, N.2    Schweitz, J.-A.3    Smith, U.4
  • 3
    • 0019556136 scopus 로고
    • Application of amorphous silicon field effect transistors in addressable liquid crystal display panels
    • A.J.Snell, K.D.Mackenzie, W.E.Spear, and P.G.LeComber, "Application of amorphous silicon field effect transistors in addressable liquid crystal display panels," Appl. Phys. vol.24, pp.357-362, 1981.
    • (1981) Appl. Phys. , vol.24 , pp. 357-362
    • Snell, A.J.1    Mackenzie, K.D.2    Spear, W.E.3    LeComber, P.G.4
  • 5
    • 0343784926 scopus 로고
    • Characterization of Al-Nd alloy thin films for interconnections of TFT-LCDs
    • Hamamatsu, Japan, Oct.
    • K.Takagi, E.Iwamura, T.Ohnishi, and K.Yoshikawa, "Characterization of Al-Nd alloy thin films for interconnections of TFT-LCDs," Proc. 15th Int. Display Research Conf., Hamamatsu, Japan, pp.461-464, Oct. 1995.
    • (1995) Proc. 15th Int. Display Research Conf. , pp. 461-464
    • Takagi, K.1    Iwamura, E.2    Ohnishi, T.3    Yoshikawa, K.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.