The influence of an electric field on the electronic structure of a surface containing defects: An embedding-potential approach

Journal of Physics Condensed Matter

Volumn 9, Issue 8, 1997, Pages 1793-1811

  Ness, H ^a   Fisher, A J ^a  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; DEFECTS; ELECTRON TUNNELING; ELECTRONIC DENSITY OF STATES; ELECTRONIC STRUCTURE; GREEN'S FUNCTION; PERTURBATION TECHNIQUES; POLARIZATION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR MATERIALS; SURFACES;

DYSON EQUATION; EMBEDDING POTENTIAL METHOD;

ELECTRIC FIELD EFFECTS;

EID: 0031072526     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/9/8/010     Document Type: Article

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