Si/SiGe CMOS: Can it extend the lifetime of Si?

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn 40, Issue , 1997, Pages 116-117

  Ismail, K ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GATES (TRANSISTOR); MICROWAVE CIRCUITS; MOS DEVICES; SCHOTTKY BARRIER DIODES; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SILICON ON INSULATOR TECHNOLOGY;

CUT OFF FREQUENCY;

CMOS INTEGRATED CIRCUITS;

EID: 0031072193     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)