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Volumn 64, Issue 2, 1997, Pages 207-210

Observation of 1H tunneling diffusion in crystalline Si

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTALLINE MATERIALS; HYDROGEN; ION IMPLANTATION; LOW TEMPERATURE PHENOMENA; SEMICONDUCTING SILICON; TRANSPORT PROPERTIES;

EID: 0031071796     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390050466     Document Type: Article
Times cited : (18)

References (21)
  • 4
    • 1542763813 scopus 로고
    • Werkstoff-Forschung und Technik, Springer, Berlin, Heidelberg
    • Th. Heumann, Diffusion in Metallen, Werkstoff-Forschung und Technik, Vol. 10 (Springer, Berlin, Heidelberg 1992), pp. 219-232
    • (1992) Diffusion in Metallen , vol.10 , pp. 219-232
    • Heumann, Th.1
  • 8
    • 5944247256 scopus 로고
    • Diploma Thesis, Heidelberg University
    • S. Fabian: Diploma Thesis, Heidelberg University (1995)
    • (1995)
    • Fabian, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.