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Volumn 33, Issue 5, 1997, Pages 348-349

Improved SC amplifiers with low sensitivity to op-amp imperfections

Author keywords

Operational amplifiers; Switched current circuits

Indexed keywords

CAPACITORS; COMPUTER SIMULATION; ELECTRIC DISTORTION; NUMERICAL METHODS; SEMICONDUCTOR DEVICE STRUCTURES; SPURIOUS SIGNAL NOISE; SWITCHES; SWITCHING CIRCUITS;

EID: 0031071786     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19970254     Document Type: Article
Times cited : (9)

References (6)
  • 1
    • 0030286542 scopus 로고    scopus 로고
    • Circuit techniques for reducing the effect of op-amp imperfections: Autozeroing, correlated double sampling, and chopper stabilization
    • November
    • ENZ, C.C., and TEMES, G.C.: 'Circuit techniques for reducing the effect of op-amp imperfections: autozeroing, correlated double sampling, and chopper stabilization', Proc. IEEE, November 1996, pp. 1584-1614
    • (1996) Proc. IEEE , pp. 1584-1614
    • Enz, C.C.1    Temes, G.C.2
  • 3
    • 0023562192 scopus 로고
    • GaAs switched-capacitor circuits for high-speed signal processing
    • LARSON, L.E., MARTIN, K.W., and TEMES, G.C.: 'GaAs switched-capacitor circuits for high-speed signal processing', IEEE J. Solid-State Circ., 1987, 22, pp. 971-981
    • (1987) IEEE J. Solid-State Circ. , vol.22 , pp. 971-981
    • Larson, L.E.1    Martin, K.W.2    Temes, G.C.3
  • 4
    • 0022582330 scopus 로고
    • SC circuits with reduced sensitivity to finite amplifier gain
    • NAGARAJ, K.: 'SC circuits with reduced sensitivity to finite amplifier gain'. Proc. IEEE Int. Symp. Circ. Syst., 1986, pp. 618-621
    • (1986) Proc. IEEE Int. Symp. Circ. Syst. , pp. 618-621
    • Nagaraj, K.1
  • 6
    • 0029716052 scopus 로고    scopus 로고
    • Reduced nonlinear distortion in circuits with correlated double sampling
    • May
    • HUANG, Y., FERGUSON, P.F., and TEMES, G.C: 'Reduced nonlinear distortion in circuits with correlated double sampling'. Proc. IEEE Int. Symp. Circ. Syst., May 1996, pp. 159-162
    • (1996) Proc. IEEE Int. Symp. Circ. Syst. , pp. 159-162
    • Huang, Y.1    Ferguson, P.F.2    Temes, G.C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.