X-ray diffraction and reflection from self-assembled Ge dots

Thin Solid Films

Volumn 294, Issue 1-2, 1997, Pages 296-299

  Darhuber, A A ^a   Stangl, J ^a   Bauer, G ^a   Schittenhelm, P ^b   Abstreiter, G ^b  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^b WALTER SCHOTTKY INSTITUT   (Germany)

Author keywords

Germanium dots; Self organized nanostructures; X ray diffraction; X ray reflection

Indexed keywords

NANOSTRUCTURED MATERIALS; PHOTOLUMINESCENCE; SEMICONDUCTING GERMANIUM; X RAY DIFFRACTION;

SELF-ASSEMBLED GERMANIUM DOTS; X RAY REFLECTION;

SEMICONDUCTOR QUANTUM DOTS;

EID: 0031071122     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0040-6090(96)09233-4     Document Type: Article

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