Photolithographic patterning of the charge-density-wave conductor RB0.30MoO3

Synthetic Metals

Volumn 86, Issue 1-3, 1997, Pages 1781-1784

  Van Der Zant, H S J ^a   Mantel, O C ^a   Heij, C P ^a   Dekker, C ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Charge density waves; Thin films; Transport measurements

Indexed keywords

CHARGE CARRIERS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTORS; ELECTRIC VARIABLES MEASUREMENT; ELECTRON TRANSITIONS; ELECTRON TRANSPORT PROPERTIES; FILM GROWTH; PHOTOLITHOGRAPHY; THIN FILM DEVICES; THIN FILMS;

CHARGE DENSITY CONDUCTOR; ELECTRICAL TRANSPORT MEASUREMENTS; PEIERLS TRANSITIONS; PHOTOLITHOGRAPHIC PATTERNING; RUBIDIUM MOLYBDENUM OXIDES;

RUBIDIUM COMPOUNDS;

EID: 0031070694     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0379-6779(96)04588-2     Document Type: Article

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