Surface modification of conjugated polymers: An application of near-field optical microscopy in sub-micron photochemistry

Synthetic Metals

Volumn 85, Issue 1-3, 1997, Pages 1421-1422

  Wei, P K ^a   Hsu, J H ^a   Fann, W S ^a   Hsieh, B R ^b  

^a INSTITUTE OF ATOMIC AND MOLECULAR SCIENCES   (Taiwan)

^b XEROX CORPORATION   (United States)

Author keywords

Atomic force microscopy; Conjugated polymers; Optical absorption; Photoinduced absorption

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONDUCTIVE PLASTICS; LIGHT ABSORPTION; OXIDATION; PHOTOCHEMICAL REACTIONS; SURFACE TREATMENT;

NEAR FIELD SCANNING OPTICAL MICROSCOPE (NSOM); PHOTOOXIDATION;

ORGANIC POLYMERS;

EID: 0031070642     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0379-6779(97)80302-5     Document Type: Article

References (6)

1. E. Betzig, J. K. Trautman, Science 257, 189 (1992).
2. E. Betzig, R. J. Chichester, Science 262, 1422 (1993).
3. M. Yan, L. J. Rothberg, F. Papadimitrakopoulos, M. E. Galvin, and T. M. Miller, Phys. Rev. Lett. 73, 744 (1994).
4. H. A. Bethe, Phys. Rev. 66, 163 (1944); C. J. Bouwkamp, Philips Res. Rep. 5, 321, P. 401 (1950).
5. H. A. Bethe, Phys. Rev. 66, 163 (1944); C. J. Bouwkamp, Philips Res. Rep. 5, 321, P. 401 (1950).
6. C. C. Wei, P. K. Wei, and W. S. Fann. Appl. Phys. Lett. 67, 3835 (1995).