Electronic properties of La3Ni2O7 and Ln4Ni3O10, Ln=La, Pr and Nd

Synthetic Metals

Volumn 85, Issue 1-3, 1997, Pages 1451-1452

  Greenblatt, M ^a   Zhang, Z ^a   Whangbo, M H ^b  

^a RUTGERS UNIVERSITY   (United States)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

Charge density waves; Low dimensional properties; Magnetic and transport measurements; Metal insulator transition

Indexed keywords

BAND STRUCTURE; CRYSTAL LATTICES; ELECTRIC CONDUCTIVITY MEASUREMENT; MAGNETIC PERMEABILITY MEASUREMENT; PARAMAGNETISM; PHASE TRANSITIONS; SEMICONDUCTOR MATERIALS; THERMOGRAVIMETRIC ANALYSIS; TRANSPORT PROPERTIES; X RAY CRYSTALLOGRAPHY;

CHARGE DENSITY WAVE; EXTENDED HUCKEL TIGHT BINDING METHOD; METAL INSULATOR TRANSITIONS;

NICKEL COMPOUNDS;

EID: 0031069749     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0379-6779(97)80312-8     Document Type: Article

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