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Volumn 159, Issue 2, 1997, Pages 509-515

Effect of ion implantation and annealing on the dielectric properties of silicon

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ANTIMONY; ARGON; BORON; COMPOSITION EFFECTS; CRYSTAL DEFECTS; ION IMPLANTATION; NEON; NITROGEN; PERMITTIVITY; PHOSPHORUS; SEMICONDUCTOR DOPING;

EID: 0031069194     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(199702)159:2<509::AID-PSSA509>3.0.CO;2-K     Document Type: Article
Times cited : (31)

References (17)
  • 15
    • 85197332380 scopus 로고
    • Naukowo-Technicznego Nowoczesne technologie elektrostatyczne, Białystok
    • P. ŻUKOWSKI, J. PARTYKA, and P. WȨGIEREK, Materialy IV Symp. Naukowo-Technicznego Nowoczesne technologie elektrostatyczne, Białystok 1995 (p. 108 to 115).
    • (1995) Materialy IV Symp. , pp. 108-115
    • Zukowski, P.1    Partyka, J.2    Wȩgierek, P.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.