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Volumn 159, Issue 2, 1997, Pages 509-515
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Effect of ion implantation and annealing on the dielectric properties of silicon
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
ANTIMONY;
ARGON;
BORON;
COMPOSITION EFFECTS;
CRYSTAL DEFECTS;
ION IMPLANTATION;
NEON;
NITROGEN;
PERMITTIVITY;
PHOSPHORUS;
SEMICONDUCTOR DOPING;
INTERSTITIAL DEFECTS;
JUMPING RECHARGING;
SEMICONDUCTING SILICON;
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EID: 0031069194
PISSN: 00318965
EISSN: None
Source Type: Journal
DOI: 10.1002/1521-396X(199702)159:2<509::AID-PSSA509>3.0.CO;2-K Document Type: Article |
Times cited : (31)
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References (17)
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