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Volumn 26, Issue 2-3 SPEC. ISS., 1997, Pages 87-92
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A Look Back at the Early Developments of Speckle Metrology
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Author keywords
[No Author keywords available]
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Indexed keywords
HISTORY;
LASER APPLICATIONS;
OPTICS;
PHOTOGRAPHY;
SPECKLE;
SPECKLE METROLOGY;
SPECKLE PHOTOGRAPHY;
INTERFEROMETRY;
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EID: 0031060080
PISSN: 01438166
EISSN: None
Source Type: Journal
DOI: 10.1016/0143-8166(95)00105-0 Document Type: Article |
Times cited : (4)
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References (8)
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