Application of Improved Speckle Contouring Technique to Surface Roughness Measurements

Optics and Lasers in Engineering

Volumn 26, Issue 2-3 SPEC. ISS., 1997, Pages 115-130

  Hertwig, Manfred ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ANGULAR SPECKLE CONTOURING TECHNIQUE; ELECTRONIC SPECKLE PATTERN INTERFEROMETRY; FRINGE DENSITY; SPECKLE PHASE IMAGES;

AUTOMATION; CONTOUR MEASUREMENT; OPTICAL CORRELATION; ROUGHNESS MEASUREMENT; SPECKLE; SPURIOUS SIGNAL NOISE; SURFACE ROUGHNESS; THREE DIMENSIONAL;

INTERFEROMETRY;

EID: 0031060061     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/0143-8166(95)00108-5     Document Type: Article

References (6)

1. Butters, J. N. & Leendertz, J. A., Holographic and video technique applied to engineering measurement. J. Meas. Control, 4 (1971), 349-354.
2. Creath, K., Phase shifting speckle interferometry. Appl. Optics, 24 (1985), 3053-3058.
3. Jones, R. & Wykes, C., Holographic and Speckle Interferometry. Cambridge University Press, Cambridge, 1983.
4. Sirohi, R. S., Speckle Metrology. M. Dekker, New York, 1993.
5. Creath, K., Measuring step heights using an optical profiler. Proc. SPIE, 661, (1986), 296-301.
6. Hertwig, M., Floureux, T. & Flemming, T., Applications of recently improved Electronic Speckle Pattern Interferometry by addition of incremental images. Proc. SPIE, 2340 (1994), 124-133.