Surface characterization of intraocular lenses [4]

Ophthalmology

Volumn 104, Issue 1, 1997, Pages 3-4

  Goldberg, E P ^a   Mamalis, N ^a   Solis, C H ^a   Servodidio, C A ^a   Woodworth K E , Jr ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; LENS IMPLANT; LETTER; MORPHOLOGY; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY;

EID: 0031052409     PISSN: 01616420     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0161-6420(97)30372-8     Document Type: Letter

References (1)

1. EP Goldberg M Yalon WE Longo Low voltage SEM for unique surface analysis of prosthetic devices JS Hanker BL Giammara Biomedical Materials and Devices. Symposium 1987 Nov 30-Dec 4; Boston, MA 1989 Materials Resource Society Pittsburgh 355 360 (Mat Res Soc Symp Proc Vol 110)