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Volumn 276, Issue , 1997, Pages 286-306

Diffraction-data processing for electronic detectors: Theory and practice

(1)  Pflugrath, James W a  

a NONE

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SYSTEM; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRONICS; IMAGE ANALYSIS; IMAGE DISPLAY; INFORMATION PROCESSING; PRIORITY JOURNAL; REVIEW; X RAY;

EID: 0031045278     PISSN: 00766879     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S0076-6879(97)76065-8     Document Type: Article
Times cited : (18)

References (27)
  • 5
    • 0003993208 scopus 로고
    • Pub. No. 269-014200, Siemens Industrial Automation Inc., Madison, WI
    • Siemens, SAINT Software Reference Manual, Pub. No. 269-014200, Siemens Industrial Automation Inc., Madison, WI (1993).
    • (1993) SAINT Software Reference Manual
  • 7
  • 8
    • 12644253668 scopus 로고
    • D. J. Thomas, Proc. R. Soc. Lond. A425, 129 (1989); Proc. R. Soc. Lond. A428, 181 (1990).
    • (1990) Proc. R. Soc. Lond. , vol.A428 , pp. 181


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.