Modern performance control of gamma-ray spectrometers for INAA

Journal of Radioanalytical and Nuclear Chemistry

Volumn 215, Issue 2, 1997, Pages 253-256

  Ammerlaan, M J J ^a   Bode, P ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; CONFERENCE PAPER; GAMMA SPECTROMETRY; INSTRUMENT; NEUTRON ACTIVATION ANALYSIS; QUALITY CONTROL; TECHNIQUE;

EID: 0030966423     PISSN: 02365731     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02034474     Document Type: Conference Paper

References (4)

1. K. DEBERTIN, R. G. HELMER, Gamma- and X-ray Spectroscopy with Semiconductor Detectors, North Holland Press Combination, 1988, p. 148.
2. R. M. LINDSTROM, M. J. J. AMMERLAAN, S. S. THEN, J. Trace Microprobe Techn., 141 (1996) 67.
3. S. S. THEN, F. D. P. GEURINK, P. BODE, R. M. LINDSTROM, A Ge-detector Signals Simulating Pulse Generator for Dead-time and Pile-up Correction in Gamma-Ray Spectrometry in INAA without Distortion of the Detector Spectrum, this Proceedings.
4. M. BLAAUW, The Holistic Analysis of Gamma-Ray Spectra in Instrumental Neutron Activation Analysis, Thesis, Delft University of Technology, 1993 (ISBN 90-73861-16-0).