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Volumn 215, Issue 1, 1997, Pages 63-68

Cold neutron prompt gamma-ray activation analysis at NIST - Recent developments

Author keywords

[No Author keywords available]

Indexed keywords

CONFERENCE PAPER; GAMMA IRRADIATION; NEUTRON ACTIVATION ANALYSIS; NUCLEAR REACTOR; RESEARCH;

EID: 0030956240     PISSN: 02365731     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02109879     Document Type: Conference Paper
Times cited : (61)

References (22)
  • 4
    • 0028137935 scopus 로고
    • Diagnostic Techniques for Semiconductor Processing
    • O. J. GLEMBOCKI, S. W. PANG, F. H. POLLAK, G. M. CREAN and G. LARRABEE (Eds), Materials Research Society, Pittsburgh, PA
    • R. L. PAUL, R. M. LINDSTROM, Diagnostic Techniques for Semiconductor Processing, MRS Symp. Proc. Vol. 324, O. J. GLEMBOCKI, S. W. PANG, F. H. POLLAK, G. M. CREAN and G. LARRABEE (Eds), Materials Research Society, Pittsburgh, PA, 1994, p. 403.
    • (1994) MRS Symp. Proc. , vol.324 , pp. 403
    • Paul, R.L.1    Lindstrom, R.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.