Microstructural evolution of the latest generation of small-diameter SiC-based fibres tested at high temperatures

Journal of Microscopy

Volumn 185, Issue 2, 1997, Pages 243-258

  Hochet, N ^a   Berger, M H ^a   Bunsell, A R ^a  

^a PSL RESEARCH UNIVERSITY   (France)

Author keywords

ceramic fibre; creep properties; Hi Nicalon; high temperature; microstructure; oxidation; silicon carbide; tensile properties; transmission electron microscopy; Tyranno Lox E; Tyranno Lox M; X ray diffraction

Indexed keywords

CARBON; CERAMIC MATERIALS; CREEP; CREEP RESISTANCE; ELASTIC MODULI; ELECTRON IRRADIATION; FIBERS; GRAIN GROWTH; GRAIN SIZE AND SHAPE; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; OXYGEN; SILICON CARBIDE; TENSILE TESTING; TITANIUM COMPOUNDS;

CREEP PROPERTIES; HI-NICALON; HIGHEST TEMPERATURE; INTERGRANULAR PHASE; SIC GRAINS; TITANIA; TYRANNO LOX-E; TYRANNO LOX-M; X- RAY DIFFRACTIONS; Β- SIC;

X RAY DIFFRACTION;

CARBON FIBER; SILICON DERIVATIVE;

CERAMICS; CONFERENCE PAPER; FIBER; HIGH TEMPERATURE; OXIDATION; PRIORITY JOURNAL; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0030946386     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1997.d01-620.x     Document Type: Conference Paper

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