Time-resolved high-resolutioin electron microscopy of atomic scale solid-state direct bonding of gold tips

Journal of Electron Microscopy

Volumn 46, Issue 2, 1997, Pages 151-160

  Kizuka, Tokushi ^a   Yamada, Kanji ^a   Deguchi, Shunji ^b   Naruse, Mikio ^b   Tanaka, Nobuo ^a  

^a NAGOYA UNIVERSITY   (Japan)

^b JEOL LTD   (Japan)

Author keywords

Bonding; Gold; High resolution electron microscopy; In situ observation; Mechanical test; Surface scanning

Indexed keywords

ATOMS; ELECTRON IRRADIATION; ELECTRONS; GOLD; SCANNING ELECTRON MICROSCOPY;

ATOMIC SCALE; BONDING; BONDING PROCESS; DIRECT BONDING; GOLD; IN-SITU OBSERVATIONS; MECHANICAL; MECHANICAL TEST; SURFACE SCANNING; TIME-RESOLVED;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 0030911131     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023502     Document Type: Article

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