Structure of a stacking fault in the (101) plane of TiO2

Journal of Electron Microscopy

Volumn 46, Issue 1, 1997, Pages 67-74

  Yamada, Susumu ^a,b   Tanaka, Michiyoshi ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b CENTRAL RESEARCH INSTITUTE OF ELECTRIC POWER INDUSTRY   (Japan)

Author keywords

convergent beam electron diffraction (CBED); high resolution electron microscope (HREM) image; HREM image simtdation; relaxation of the lattice; stacking fault; TiO2 (rutile)

Indexed keywords

ELECTRON DIFFRACTION; ELECTRON MICROSCOPES; ELECTRONS; HIGH RESOLUTION ELECTRON MICROSCOPY; OXIDE MINERALS; STACKING FAULTS;

CONVERGENT BEAMS; CONVERGENT-BEAM ELECTRON DIFFRACTION ,; ELECTRON MICROSCOPE IMAGES; HIGH RESOLUTION ELECTRON MICROSCOPES; HIGH-RESOLUTION ELECTRON MICROSCOPE IMAGE,; HIGH-RESOLUTION ELECTRON MICROSCOPE IMAGE SIMULATION,; IMAGES SIMULATIONS; RELAXATION OF THE LATTICE; STACKING FAULT,; TIO2(RUTILE),;

TITANIUM DIOXIDE;

EID: 0030899947     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023491     Document Type: Article

References (9)

1. Ashbee K H G, Smallman R E, and Williamson G K (1963) Stacking faults and dislocations in titanium dioxide, with special reference to non-stoichiometry. Proc. R. Soc. A 276: 542-552.
2. Landuyt J V, Gevers R, and Amelinckx S (1964) Electron microscopic study of twins, anti-phase boundaries, and dislocations in thin films of rutile. Phys. Stat. Sol. 7: 307-329.
3. Landuyt J V, Gevers R, and Amelinckx S (1964) Fringe patterns at anti-phase boundaries with α = π observed in the electron microscope. Phys. Stat. Sol. 7: 519-546.
4. Landuyt J V (1966) Determination of the displacement vector at the anti-phase boundaries in rutile by contrast experiments in the electron microscope. Phys. Stat. Sol. 16: 585-590.
5. Bursill L A and Hyde B G (1970) The displacement vectors of {132} and {101} faults in rutile. Proc. R. Soc. A 320: 147-160.
6. Landuyt J V, Ridder R D, Gevers R, and Amelinckx S (1970) Diffraction effects due to shear structures : a new method for determining the shear vector. Mat. Res. Bull. 5: 353-362.
7. Smith D, Bursill L A, and Blanchin M G (1984) The structure of extended defect terminations in rutile. Phil. Mag. A 50: 473-485.
8. 2 by convergent-beam electron diffraction. J. Electron Microsc. 44: 212-218.
9. Tanaka M and Terauchi M (1985) Convergent-beam Electron Diffraction. pp. 38-39. JEOL-Maruzen,Tokyo.